IEC 62380 PDFIEC 62380 PDF

IEC European Standard electronic reliability prediction software. Download a free trial now. IEC Electronic Reliability Prediction. The latest release from ITEM Software is an extraordinary collection of new capabilities that provides a customizable. IEC/TR Reliability data handbook Universal model for reliability prediction of electronics components, PCBs and equipment.

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It has didactical shortages and structural flaws. Ground; stationary; non-weather protected equipment for stationary use on the ground in non-weather protected locations. For majority of the applications, a day is corresponding to one cycle, and temperature change? However, only the greater temperature variation has to be taken uec account, because the highest one has the main effect on the reliability of the device packages and on the mounting process. Wear-out mechanisms may give rise to systematic failures after too short a period of time; electro-migration in active components is an example.

The thermal 662380 seen by components during the variety of “mission profiles” undergone by the equipment, replace the difficult to evaluate environment factor of other standards.

IEC is a significant step forward in reliability prediction when compared to older reliability standards. These facilities enable you to experiment with temperature, environmental and stress settings and see how your system performance will vary.

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It makes equipment reliability optimization studies easier to carry out, thanks to the introduction of influence factors. For a list of referenced documents that are indispensable for the application of this method click here.

The IEC module provides models for reliability prediction of electronic components, optical cards, printed circuit boards and equipments, which takes directly into account the influence of the environment. Visit the Isograph Blog The Isograph Blog contains a wealth of additional information on Isograph products and services. IEC is a significant step forward in reliability prediction when compared to older reliability standards.

This difference is due to residual overloads, since the equipment is assumed adequately protected. Features Powerful and user friendly IEC standard reliability prediction software Linked block facility reduces repetitive data entry Redundancy modeling including hot standby Multi systems within the same project Extensive component libraries to reduce entry time Multi document interface allows easy transfer of data Powerful charting facilities IEC Reference Documents The following referenced documents are indispensable for the application of this method.

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Non-intrinsic failures due to electrical overloads The reliability of the components used in equipment located “at the heart” of a system, is significantly better than that of the lec located at the periphery connected to the external environment.

Dealing adequately with technical uncertainties. Focused on reliability, safety, and risk assessment, our iQT product is a highly extensible framework that provides common infrastructure for any kind of system modeling. A daily temperature variation is always superimposed to a permanent working phase according to the environment of the equipment. Users can construct hierarchical breakdowns of systems with no restrictions on block numbers or levels of indenture. This technical report provides elements to calculate failure rate of mounted electronic components.

For undated references, the latest edition of the referenced document including any amendments applies.

International Electrotechnical Commission IEC models take into account the influence of the environment as a significant factor in the predicted reliability. The RDF reliability prediction method accounts for the effects of both ambient temperature variation and equipment switch on and switch off temperature variations on the component failure rate.

Ground; non stationary; moderate equipment for non-stationary use on the ground in moderate conditions of use. Contact us now for a price list, free trial or quotation: Its unique approach and methodology has gained worldwide recognition. However, the integration density for integrated circuits continues to grow at the iecc rate as in the past, at constant reliability figure. These powerful facilities transfer as much of the available information as possible, saving you valuable time and effort.

By following the predefined interface, your team has the ability to create plug-ins that extend the capabilities of iQT. IEC TR failure rate prediction software.

Open and Extensible Focused on reliability, safety, and risk assessment, our iQT product is a highly extensible framework that provides common infrastructure for any kind of system modeling. All extensions are highly modular.

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IEC 62380 Reliability Prediction

Taking into account MOORE’s law, it is necessary to know the manufacturing year to calculate the failure rate of integrated circuits. New editors or viewers for a given model file type New quantification model types New result types New analysis engines The well-established core services of this platform provide the essential functionality to model and analyze reliability, risk and safety projects.

This technical report provides elements to calculate failure rate of mounted electronic components. Powerful and user friendly IEC standard reliability prediction software. Classification of groups of environmental parameters and their severities IEC all partsThermistors – Directly heated positive step-function temperature coefficient IEC all parts Semiconductor devices – Discrete devices IEC all Parts 12 Semiconductor devices – Part Wear-out period is not far into the future.

This technical report provides elements to calculate failure rate of mounted electronic components.

Storage or dormant phases mode with various average outside temperature changes the equipment is exposed to. Each reliability prediction module is designed to analyse and calculate component, sub system and system failure rates, including Mean Time Between Failure MTBFin accordance with the appropriate standard. This is called life expectancy, and is subject to influencing factors. IEC-TR and its predecessors are the only standards that can handle not only constant temperatures, but also temperature variations.

The time quantity, is the number of calendar hours of the installed equipment, including working as well as storage or dormant hours. Optoelectronic devices – Section 2: Unique Features Wear-out period For the vast majority electronic components, the wear-out period is very far out from the periods of use or lifetime.

To download a free demonstration of our IEC software click here. It makes equipment reliability optimization studies easier to carry out, thanks to the introduction of influence factors.